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Etch Hard Mask Film

Etch hard mask film materials is strongly required for wafer patterning below 70nm device. 1-Hexene and Propylene are deposited by CVD(Chemical Vapor Deposition) equipment and it forms ACL(Amorphous Carbon Layer). These hard mask have high etch resistance from high carbon content, it helps to define micro pattern on wafer.

Etch Hard Mask Film

Product Structure Property MSDS
1-Hexene Molecular Formula
Molecular Weight
Boiling Point
Vapor Pressure
Physical State/Color
Water Reactivity
: C6H12
: 84.16g/mol
: 60~66¡É
: 21¡É/155torr
: Colorless liquid
: Stable
Propylene Molecular Formula
Molecular Weight
Boiling Point
Vapor Pressure
Physical State/Color
Water Reactivity
: C3H6
: 42.08g/mol
: -47¡É
: 37¡É/15.4atm
: Colorless Gas
: Stable
4MS   Molecular Formula
Molecular Weight
Boiling Point
Vapor Pressure
Physical State/Color
Water Reactivity
: C4H12Si
: 88.22g/mol
: 26~28¡É
: -
: Colorless liquid
: Stable
3MS   Molecular Formula
Molecular Weight
Boiling Point
Vapor Pressure
Physical State/Color
Water Reactivity
: C3H10Si
: 74.20g/mol
: 6.7¡É
: -
: Colorless Gas
: Stable